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Certified Pre-Owned XRF LIBS & OES Analyzers from AMERICA'S #1 RESELLER
Certified Pre-Owned XRF LIBS & OES Analyzers from AMERICA'S #1 RESELLER

Olympus Vanta - Pre-Cut Film for Mining & Geochemistry

$90.00
SKU

Olympus Vanta Pre-Cut Film – Precision Protection for Mining & Geochemistry Samples

Optimized XRF Analysis with Superior Sample Integrity

The Olympus Vanta Pre-Cut Film is a high-performance, ready-to-use protective film designed specifically for mining exploration and geochemical analysis with Vanta series XRF analyzers. These precision-cut films ensure contamination-free measurements while providing optimal transmission for accurate light element detection.

Key Advantages:

 Engineered for Geochemistry – Ultra-thin yet durable formulation maximizes sensitivity for Mg, Al, Si, P, S and other critical light elements
 Consistent Quality – Manufactured to exacting standards for repeatable results across all your samples
 Time-Saving Convenience – Pre-cut to standard sizes (4μm or 6μm thickness options) for immediate use with sample cups
 Contamination Barrier – Protects analyzer window from abrasive mining samples while allowing optimal X-ray transmission
 Bulk Packaging – Available in cost-effective multi-packs for high-volume testing environments

Ideal Applications:

  • Ore Grade Control – Precise measurement of valuable elements in exploration samples

  • Core Sample Analysis – Protects analyzer while maintaining measurement accuracy

  • Soil & Sediment Testing – Ensures reliable detection of trace elements

  • Mine Site QA/QC – Standardizes sample presentation for consistent results

Technical Specifications:

  • Material: High-purity polypropylene or mylar (specify based on model)

  • Thickness Options: 3.5μm, 4μm, or 6μm variants available

  • Diameter: Standard 31mm

  • Compatibility: Works with all Vanta series XRF analyzers and standard sample cups

Why Professionals Choose Vanta Pre-Cut Film:
 25% Faster Setup vs. manual film cutting
 Eliminates Measurement Variability from uneven film application
 Reduces Analyzer Maintenance by preventing sample contact with detector window


Available Variations:
 Ultra-Thin (3.5μm): Maximum light element sensitivity
 Standard Duty (6μm): Enhanced durability for abrasive samples
 Anti-Static: For fine powder analysis in dry conditions